SWIR Vision Systems
Responsibilities
1. Support day-to-day operation and monitoring of SiC Epitaxy mass production processes
2. Perform defect inspection, analysis, and quality data management for SiC substrates and Epi wafers
3. Execute and support metrology methods for evaluating SiC substrate and Epi properties
4. Conduct process experiments and validations under guidance of senior engineers
More details about our company benefits can be found here:
| We are committed to sourcing, attracting, and hiring high-performance innovators, while providing all candidates a positive recruitment experience that builds our brand as a great place to work. |
Qualifications
1. Bachelor’s degree in science or engineering
2. Preferred majors: Materials Science, Semiconductor Engineering/Devices, Metallurgical Engineering, Chemical Engineering, Solid-State Physics, or related fields
Preferred Qualifications
1. Basic understanding of semiconductor processes, thin-film growth, or crystal growth
2. Hands-on experience with characterization or inspection tools (PL, XRD, AFM, SEM, Optical Inspection, etc.)
3. Fundamental skills in data analysis and basic statistics